Substrate · Standard chip size: 1.6×3.4×0.3 mm. · Cross-section is trapezium-shape. · High reflective chemically stable Au back side coating (reflectivity is 3 times better in comparison with uncoated probes). · Compatible with the most of commercialAFM devices. · The base silicon is highly doped to avoid electrostatic charges.
Cantilever · Rectangular shape. · Cross-section is trapezium-shape. · Backside width is given in probes specifications. · Available for contact, semicontact and noncontact modes. · Tip is set on the controlled distance 5-20мm from the free cantilever end.
Tip · Total tip shape is tetrahedral, the last 500nm from tip apex is cylindrical. · Tip height: 14 – 16 мm. · Typical curvature radius: – of uncoated tips 6 nm, guaranteed 10nm; – of coated tips 35nm. · Tip offset: 5 – 20 мm. · Tip aspect ratio: 3:1 – 7:1. · Front plane angle: 10°±2°. · Back plane angle: 30°±2°. · Side angle (half): 18°±2°. · Cone angle at the apex: 7° – 10°.	Side View Sketch Front View Sketch

“Golden” Silicon Probes are available:
· with Au and Al reflective coating
· with PtIr, TiN, Au, diamond doped conductive coating
· with CoCr magnetic coating
· with no coatings (bare)
· tipless

Probes are packaged in GelPak® boxes. (GelPak® is a registered trade mark of Vichem
Corporation)

Guaranteed product yield is better than 90%.
Available cantilever bent angle

Warranty: 1 year for uncoated probes and probes with reflective coating
6 months for probes with conductive coating
3 months for probes with magnetic coating