HA_HR/W2C

300.00 820.00 

HA_HR/W2C/15 (15 separated chips): 300,00 €
HA_HR/W2C/50 (50 separated chips): 820,00 €
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Description

ETALON is a new series of excellent composite AFM probes.

In terms of quality-to-price ratio, it has no analogues in the world market.
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with stable and wear-resistant long lifetime W2C conductive coating.


The main advantages of W2C coated probes are:
Hard coating which stays stable at applied high voltages and flowing currents at the contact point ‘tip-sample’ which cannot be received with standard metal coated probes (Fig.1-3);

High conductivity (close to metal conductivity);

Typical curvature radius less than 35nm.


Fig.1 VAC of just cleaved HOPG provided by HA_HR_W2C probe.
Coating is stable at +/- 10 Volts and continues operating after long intensive use.

Fig.2 VAC of just cleaved HOPG provided by HA_HR_Pt probe.
Coating is stable at +/- 1,5 V.
Fig.3 VAC of just cleaved HOPG provided by HA_HR_Pt probe.
Coating is destroyed at applied voltage 2 V.
Cantilever type A B Typical dispersion
Length, L (µm) 93 123 ± 2
Width, W (µm) 34 34 ± 3
Thickness, H (µm) 3 3 ± 0.15
Force Constant (N/m) 34 17 ±20%
Resonant frequency (kHz) 380 230 ±10%

Additional information

Tip sideW2C (20-30 nm)
Tip shapeOctahedral at the base, conic on the last 200 nm
Tip cone angle φ30 degrees on the last 200 nm
Full tip height≥10 µm
Pedestal/tip ratio1:1
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MaterialPolysilicon lever, monocrystal silicon tip
Chip size3.6×1.6×0.4 mm
Reflective sideAu (20-30 nm)
Tip sideW2C (20-30 nm)
Cantilever number2 rectangular
Tip shapeOctahedral at the base, conic on the last 200 nm
Tip cone angle φ30 degrees on the last 200 nm
Full tip height≥10 µm
Pedestal/tip ratio1:1
Tip curvature radiusless than 35 nm