Description
TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P series
TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
 |
 |
| Image in optical microscope (TOP VISUAL probe is under the investigated sample). |
Topography image of the sample made by TOP VISUAL probe. |
