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VIT_P_C-A

405.00 € – 1,190.00 €

TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P_C-A series
VIT_P_C-A/50 (50 separated chips) – 1190,00 €
VIT_P_C-A/15 (15 separated chips) – 405,00 €

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Description

TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

Image in optical microscope
(TOP VISUAL probe is under the investigated sample).		 Topography image of the sample made by TOP
VISUAL probe.

Additional information

Front coatingNone
Tip curvature radiustypical 6nm, guaranteed 10nm
Tip shapePyramidal
Tip height14-16 um
Resonant frequency (kHz)min.: 8 typical: 16 max.: 25
Force constant (N/m)min.: 0.3 typical: 0.6 max.: 1
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Cantilever seriesVIT_P_C-A
MaterialSi
Chip size3.4×1.6×0.3mm
Reflective sideAl
Front coatingNone
Cantilever number1 rectangular
Tip curvature radiustypical 6nm, guaranteed 10nm
Tip shapePyramidal
Tip height14-16 um
Cantilever length (±20µm)450
Cantilever width (±1µm)50
Cantilever thickness (±1 µm)2.5
Resonant frequency (kHz)min.: 8 typical: 16 max.: 25
Force constant (N/m)min.: 0.3 typical: 0.6 max.: 1

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